| Title |
Description |
Register |
Date |
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A New Approach to Mobile Product Design That Reduces Development Time |
Stay Ahead in a Feature-Obsessed World -- This webinar will tackle the challenges of “cramming” more features into mobile devices. It will shed light on design techniques that enable rapid feature expansion while managing critical power and mechanical design issues. Sponsored by Toshiba. |
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11/04/2009 |
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Upgrading to Li-ion from Sealed Lead Batteries to Optimize Portable Performance |
Manufacturers of mobile equipment can achieve lighter weight, longer runtime, faster charge time and longer shelf-life with new Lithium-ion (Li-Ion) battery technology over older Sealed Lead Acid (SLA) batteries. This webcast presents guidelines on implementing Li-Ion technology in current and future products. Sponsored by Micro Power. |
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10/28/2009 |
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One Powerful Day: Live on September 29, 2009 |
Attend One Powerful Day, the Electronic Design Group's FREE online power conference on September 29th, 2009. Join editors Don Tuite and Sam Davis as they bring design engineers a day full of Web conferences on the latest power topics. Sessions inlclude: Things I wouldn’t do to a FET , Thermal Management: Heat Pipe Dreams, Safety Considerations in Power Supply Design, Pairing Ultracapacitors with Batteries in Transportation Applications or Controlling Permanent Magnet Synchronous Motors. Sponsored by Intersil, International Rectifier and Texas Instruments. Register now |
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09/29/2009 |
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De Embedding Fixtures for Accurate Signal Integrity Measurement |
High bit rates in serial data transmission create challenges in measurement accuracy caused by imperfections in fixtures and cables between the device under test and the measurement instrument. The common measurement practice in microwave engineering of using scattering matrix parameters or s-parameters offers an effective way of compensating for these imperfections. This webinar will cover the theory and practice of using s-parameters to measure and then de-embed fixtures, cables, and interconnects and improving the accuracy of signal integrity measurements. |
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08/15/2009 |
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Semiconductor Capacitance-Voltage (C-V) Testing Fundamentals |
This seminar is designed to introduce the topic of C-V measurements as they relate to semiconductor device and materials characterization. C-V testing is commonly used to determine semiconductor parameters such as doping profiles, density of interface states, threshold voltages, oxide charge, and carrier lifetime.
What you will learn:
- What is C-V testing
- What types of devices can C-V testing be used to characterize
- Who can use C-V
- C-V measurement challenges
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06/02/2009 |
|
One Powerful Day |
|
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03/31/2009 |
|
Building Battery Arrays with Lithium-Ion Cells |
Sponsored by Micro Power |
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03/03/2009 |
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Practical Considerations for Embedded Wireless Design & Certification |
Sponsored by Cypress Semiconductor |
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02/25/2009 |
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Advanced Characterization and Troubleshooting of High Speed Serial Data and Clocks |
Sponsored by LeCroy |
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02/25/2009 |
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Advances in Testing Embedded Systems |
Dr. Michael Lauterbach
Director
Product Management
LeCroy Corporation
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11/12/2008 |
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Scaling Engineering and Scientific Performance for the Workgroup – What’s the Best Infrastructure for You? |
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11/06/2008 |
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Why Vent? The Science Behind Improving Product Life For Rugged Electronics |
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10/22/2008 |
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One Powerful |
The Electronic Design Group bring the latest in power design information direct to you, the Power Designer, with the premier of ONE POWERFUL DAY, a FREE online conference with a full day of top speakers on top topics via web conferencing. The conference brings you up to date on the latest in Power Design, and you can pick and choose the free sessions that benefit you the most. With invited speakers and a conference program designed and hosted by the top editors in the world of Power Electronics, you can be sure that this conference with be on target with your information needs as a power system designer. These sessions will be moderated by David Morrison, Editor in Chief of Power Electronics Technology; Don Tuite, Technology Editor/Analog & Power, Electronic Design; Sam Davis, Editor, Find Power Products. |
|
10/15/2008 |
|
One Powerful Day |
The Electronic Design Group bring the latest in power design information direct to you, the Power Designer, with the premier of ONE POWERFUL DAY, a FREE online conference with a full day of top speakers on top topics via web conferencing. The conference brings you up to date on the latest in Power Design, and you can pick and choose the free sessions that benefit you the most. With invited speakers and a conference program designed and hosted by the top editors in the world of Power Electronics, you can be sure that this conference with be on target with your information needs as a power system designer. These sessions will be moderated by David Morrison, Editor in Chief of Power Electronics Technology; Don Tuite, Technology Editor/Analog & Power, Electronic Design; Sam Davis, Editor, Find Power Products. |
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10/15/2008 |
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Read Pacing: A Performance Enhancing Feature of PCI Express Gen 2 Switch Devices |
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07/01/2008 |
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Supercharging Products With Embedded RFID |
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06/26/2008 |
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Aftermarket Battery Packs - Revelations from Product Tear-Downs |
Robin Sarah Tichy, Technical Marketing Manager, Micro Power
Don Tuite, Analog/Power Editor, Electronic Design |
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06/11/2008 |
|
Wireless Sensing Networks: A Survey Of Design Options |
Robert Repas Electrical/Electronics Editor; Machine Design |
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04/30/2008 |
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Improving The Accuracy Of Eye Pattern Measurements |
Michael Schnecker
Business Development Manager
LeCroy
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04/09/2008 |
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Leveraging ESL Techniques for Low-Power Design |
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02/13/2008 |
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Advanced Jitter Concepts And Correlation |
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01/16/2008 |
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Portable Designs with High Power Batteries and Chargers |
Robin Sarah Tichy, Ph.D. |
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12/05/2007 |
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Exploring How Good GUIs Drive Adoption in the Digital Power Management Space |
Don Tuite
Deepak Savadaatt |
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10/24/2007 |
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Finding and Troubleshooting Intermitten Signal Faults |
Dr. Michael Lauterbach |
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10/16/2007 |
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Test Challenges in the Wireless World |
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10/11/2007 |
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Guidelines for Mixed-Signal PHY IP Integration, Debug and Test |
Navraj Nandra;
Moderator: Dave Maliniak |
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10/10/2007 |
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Exploring Design and Test Challenges in the Wireless World: Bluetooth |
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09/20/2007 |
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Signal Integrity Measurement in Multi-Gigabit Serial Data Systems |
Michael Schnecker |
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09/18/2007 |
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Exploring Design and Test Challenges in the Wireless World: ZigBee |
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06/14/2007 |
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Exploring Design and Test Challenges in the Wireless World: Wi-Fi |
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05/17/2007 |
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Innovations in Battery and Charger Technologies for Portable Electronic Devices |
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05/16/2007 |
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Explorng Design and Test Challenges in the Wireless World: UltraWideBand (UWB) |
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03/22/2007 |
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Exploring Design and Test Challenges in the Wireless World: WiMax |
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02/22/2007 |
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Precluding Battery System Failures in Portable Electronics |
Troy A. Hayes, Ph.D., P.E.,
Managing Engineer, Exponent Failure Analysis Associates
Robin Sarah Tichy, Ph.D.,
Technical Marketing Manager, Micro Power Electronics |
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10/19/2006 |
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Getting More Out of Your Digital Oscilloscope |
LeCroy |
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09/21/2006 |
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RoHS: What About China? |
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07/20/2006 |
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Composite Current Source (CCS) Modeling |
Synopsys |
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06/14/2006 |
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HSpice—Just Got Faster, Again |
Synopsys |
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05/17/2006 |
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Supercharging Products With Embedded RFID |
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06/26/2005 |
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Supercharging Products With Embedded RFID |
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06/26/2005 |
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One Powerful Day |
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03/31/2005 |
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De Embedding Fixtures for Accurate Signal Integrity Measurement |
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01/01/2005 |
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De Embedding Fixtures for Accurate Signal Integrity Measurement |
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01/01/2005 |